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"Highly sensitive strain detection in strained silicon by surface enhanced Raman spectroscopy" Applied Physics Letters, vol. 86, 263114 (2005). - Y. Saito, M. Motohashi, N. Hayazawa, M. Iyoki, and S. Kawata, "Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode" Applied Physics Letters, vol. 88, 143109 (2006) (Selected for Virtual Journal of Nanoscale Science & Technology, vol. 13, Issue 15, (2006)) - N. Hayazawa, Y. Saito, M. Motohashi, M. Iyoki, and S. Kawata, "Nanoscale characterization of localized strain in crystals by tip-enhanced Raman spectroscope in reflection-mode" Proceedings of SPIE., vol. 6324, 63240L (2006) - N. Hayazawa, M. Motohashi, Y. Saito, H. Ishitobi, A. Ono, T. Ichimura, P. Verma, and S. Kawata, " Visualization of localized strain of a crystalline thin layer at the nanoscale by tip-enhanced Raman spectroscope and microscope "(Invited Article) Journal of Raman Spectroscopy, vol. 38, pp. 684-696 (2007). - Y. Saito, M. Motohashi, N. Hayazawa, and S. Kawata, "Stress imaging of semiconductor surface by tip-enhanced Raman spectroscopy" Journal of Microscopy, vol. 229, pp. 217-222 (2008). -N. Hayazawa, M. Motohashi, Y. Saito, and S. Kawata, " Characterization of localized strain of crystals in nano-scale by tip-enhanced Raman spectroscope and microscope " Proceedings of SPIE., vol. 6769, 67690P (2007) -A. Ono, K. Masui, Y. Saito, T. Sakata, A. Taguchi, M. Motohashi, T. Ichimura, H. Ishitobi, A. Tarun, N. Hayazawa, P. Verma, Y. Inouye, and S. Kawata, "Active control of the oxidization of a silicon cantilever for the characterization of silicon-based semiconductors" Chemistry Letters, vol. 37, pp. 122-123 (2008). -M. Motohashi, N. Hayazawa, A. Tarun, and S. Kawata, "Depolarization effect in reflection-mode TERS for Raman active crystals" Journal of Applied Physics, vol. 103, 034309 (2008). -A. Tarun, N. Hayazawa, M. Motohashi, and S. Kawata, "Highly efficient tip-enhanced Raman spectroscopy and microscopy of strained silicon in nanoscale" Review of Scientific Instruments, vol. 79, 013706 (2008). -–{‹´³Žj, ꎓ¡Œ‹‰Ô, ‘àV‹I•F, ‰Í“c‘, "”½ŽËŒ^ƒ`ƒbƒv‘‹‹ßÚꃉƒ}ƒ“•ªŒõ‚É‚æ‚é˜c‚݃VƒŠƒRƒ“‚̃iƒmƒXƒP[ƒ‹‘ª’è" t‹G‘æ53‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï (“Œ‹ž“s, 2006”N3ŒŽ26“ú). -–{‹´³Žj, ‘àV‹I•F, ꎓ¡Œ‹‰Ô, ‰Í“c‘, "•ÎŒõ§Œä”½ŽËŒ^‹ßÚꃉƒ}ƒ“•ªŒõ‚É‚æ‚錋»˜c‚Ý‚Š´“xƒCƒ[ƒWƒ“ƒO" t‹G‘æ54‰ñ‰ž—p•¨—Šw‰ïŠwpu‰‰‰ï (_“Þ쌧, 2007”N3ŒŽ28“ú) -Masashi Motohashi, Norihiko Hayazawa, Yuika Saito, Satoshi Kawata, "Characterization of local strain in strained Si by tip-enhanced Raman Spectroscope in reflection Mode" 4th INTERNATIONAL CONFERENCE ON ADVANCED VIBRATIONAL SPECTROSCOPY (Corfu, Greece, June 13, 2007). - –{‹´³Žj, ‘àV‹I•F, A. Tarun, ‰Í“c‘, "•ÎŒõ‰ðÁŒø‰Ê‚ð—p‚¢‚½”½ŽËŒ^TERS‚É‚æ‚錋»‚Ì‹ÇŠ˜c‚Ý•]‰¿" •½¬19”N“xŒ°”÷•ªŒõ•”‰ïƒVƒ“ƒ|ƒWƒEƒ€ (“Œ‹ž“s, 2007”N10ŒŽ26“ú). - –{‹´³Žj, ‘àV‹I•F, A. Tarun, ‰Í“c‘, "High contrast Nano imaging of crystalline silicon by TERS based on depolarization detection," •½¬19”N“x“ú–{•ªŒõŠw‰ï”NŽŸu‰‰‰ï (“Œ‹ž“s, 2007”N11ŒŽ13“ú). ã‚É–ß‚é |
